2018 - Sustainable Industrial Processing Summit & Exhibition
4-7 November 2018, Rio Othon Palace, Rio De Janeiro, Brazil
| Nanotwinning in Materials: A Worthy Defect for Superior Properties Pragati Kumar1; Prateek Uttam1; Nupur Saxena1; 1CENTRAL UNIVERSITY OF JAMMU, JAMMU, jammu, India; PAPER: 242/Composite/Regular (Oral) SCHEDULED: 14:25/Tue./Grego (50/3rd) ABSTRACT: This article reviews current primary analysis on twin boundaries defect at nano-regime. We emphasis essentially on studies that intent to understand, through modelling, experiments, or both, the origin and effects of twinning at elementary level. We foresee that, by imparting an extensive viewpoint on the happening progress in twinning, this analysis will pitch in the juncture for designing or tracing new metallic and semiconductor materials with modified alter properties like thermoelectric<sup>1</sup>, mechanical<sup>2</sup>, optical<sup>3,4</sup>, ferroelectric and magnetic<sup>5</sup> etc. Since it is nearly unworkable to slog with defect free or impurity free materials, it is vital to comprehend how defects and impurities modify the properties of the materials. To be specific, it is more necessary to differentiate between distinct types of impurities (defects) and decide if their existence is favourable or not, so that we can use it as per our requirement and can be used in different application by enhancing various properties of the material. We have analysed these issues and provided an updated overview of the current characterization tools able to identify and detect defects in different forms of materials, and also made an overview on the possible applications References: [1] G. Li, S.I. Morozov, Q. Zhang, Q.An, P. Zhai, and G.J. Synder, Physical Review Letter 119 (2017) 215503. [2] I.A. Ovidako and A.G Sheinerman, Rev.Adv.Mater.Sci.44(2016)1 [3] Y.Q. Wang, R. Smirani and G.G. Ross Nano Lett. 4, (2004) 2041. [4] P. Kumar, N. Saxena, F. Singh and A. Agarwal, Physica B:Condensed Matter 407 (2012) 3347 [5] X. Li, C. Lu, J. Dai, S. Dong, Y. Chen, N. Hu, G. Wu, M. Liu, Z. Yan and J.M Liu, Scientific Reports 4 (2014) 7019 |
