2018 - Sustainable Industrial Processing Summit & Exhibition
4-7 November 2018, Rio Othon Palace, Rio De Janeiro, Brazil
Seven Nobel Laureates have already confirmed their attendance: Prof. Dan Shechtman, Prof. Sir Fraser Stoddart, Prof. Andre Geim, Prof. Thomas Steitz, Prof. Ada Yonath, Prof. Kurt Wüthrich and Prof. Ferid Murad. More than 400 Abstracts Submitted from about 60 Countries.
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    In-situ X-ray Synchrotron Profile Analysis during High Pressure Torsion Deformation
    Erhard Schafler1; Michael Kerber2; Florian Spieckermann3;
    1UNIVERSITY OF VIENNA, Wien, Austria; 2UNIVERSITY OF VIENNA, Vienna, Austria; 3UNIVERSITY OF LEOBEN, Leoben, Austria;
    PAPER: 241/SISAM/Invited (Oral)
    SCHEDULED: 11:45/Wed./Copacabana A (150/1st)



    ABSTRACT:
    X-Ray Line Profile Analysis is a powerful method to characterize the microstructure of deformed materials, especially when high energy and brilliant Synchrotron radiation enables investigations with high time and spatial resolution. Parameters like dislocation density, dislocation arrangement, scattering domain size, and its distribution are parameters of a physical model of peak broadening, which can be applied to high quality diffraction measurements. A small sample high-pressure-torsion-machine was designed in order to perform in-situ diffraction experiments during the deformation process at hydrostatic pressures up to 8GPa in order to follow the strain as well as pressure induced microstructural characteristics of any deformed material. This was possible with the ideal design and equipment at the High-Energy-Materials-Science-beamline at PETRA III in Hamburg. Recent and first results of experiments on HPT-deformed Ni, Ti and BMGs are presented [1].

    References:
    [1] E. Schafler, M.B. Kerber,F. Spieckermann, T. Fischer, R. Schuster, C. von Baeckmann in: Magnesium Technology 2017, ed. K.N. Solanki, D. Orlov et al., Springer, pp. 645-651 (2017)