2016-Sustainable Industrial Processing Summit
SIPS 2016 Volume 2: Dubois Intl. Symp. / Complex Metallic Systems

Editors:Kongoli F, Kobe S, Calin M, Dong C
Publisher:Flogen Star OUTREACH
Publication Year:2016
Pages:130 pages
ISBN:978-1-987820-38-6
ISSN:2291-1227 (Metals and Materials Processing in a Clean Environment Series)
CD-SIPS2016_Volume1
CD shopping page

    Developing a TEM-based Nanolab for Materials Research

    Litao Sun1;
    1SOUTHEAST UNIVERSITY, Nanjing, China;
    Type of Paper: Plenary
    Id Paper: 434
    Topic: 36

    Abstract:

    Based on the idea of "setting up a nanolab inside a TEM", we present our recent progress in nanomaterials research including in situ growth, nanofabrication with atomic resolution, in situ property characterization, nanodevice construction and possible applications. The electron beam can be used as a tool to induce nanofabrication on the atomic scale. Additional probes from a special-designed holder provide the possibility to further manipulate and measure the electric/mechanical properties of the nanostructures in the small specimen chamber of a TEM. Recently, the optical signal also was introduced into the electron microscope to enrich the coverage of investigation inside the multifunctional nanolab. All phenomena from the in-situ experiments can be recorded in real time with atomic resolution.

    Keywords:

    Nanolab; in situ microscopy; structure-property relationship; Characterizaition

    Cite this article as:

    Sun L. Developing a TEM-based Nanolab for Materials Research. In: Kongoli F, Kobe S, Calin M, Dong C, editors. Sustainable Industrial Processing Summit SIPS 2016 Volume 2: Dubois Intl. Symp. / Complex Metallic Systems. Volume 2. Montreal(Canada): FLOGEN Star Outreach. 2016. p. 48-49.